Paul G Kotula1, Michael R Keenan, Joseph R Michael
1Sandia National Laboratories, Materials Characterization Department, P.O. Box 5800, MS0886, Albuquerque, NM 87185-0886, USA. pgkotul@sandia.gov
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Researchers developed a 3D microanalysis technique using scanning electron microscopy (SEM)/focused ion beam (FIB) and energy-dispersive X-ray spectroscopy (EDS). This tomographic spectral imaging (TSI) method enables detailed material analysis for applications like corrosion studies.
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