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Related Concept Videos

Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Atom probe specimen fabrication methods using a dual FIB/SEM.

D W Saxey1, J M Cairney, D McGrouther

  • 1Australian Key Centre for Microscopy & Microanalysis, University of Sydney, Sydney, NSW 2006, Australia. david.saxey@emu.usyd.edu.au

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Dual Focused Ion Beam/Scanning Electron Microscopes (FIB/SEM) offer versatile solutions for atom probe specimen preparation. New techniques enable site-specific analysis for challenging materials and geometries, enhancing research capabilities.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Nanotechnology

Background:

  • Atom probe tomography requires specialized specimen preparation.
  • Traditional methods face challenges with specific materials and geometries.
  • Focused Ion Beam/Scanning Electron Microscopy (FIB/SEM) offers advanced capabilities.

Purpose of the Study:

  • To present versatile FIB/SEM techniques for atom probe specimen preparation.
  • To address challenges in preparing specimens from difficult materials.
  • To detail methods for site-specific analysis.

Main Methods:

  • Utilizing a dual FIB/SEM system with in situ lift-out.
  • Developing a 'cut-out' technique for rapid micro-tip preparation from bulk samples.
  • Implementing a 'lift-out' technique for in situ or ex situ preparation without pre-sharpened points.

Main Results:

  • Demonstrated the versatility of FIB/SEM for preparing diverse specimen types.
  • Successfully prepared specimens from materials unsuitable for electropolishing.
  • Enabled site-specific analysis through advanced preparation methods.

Conclusions:

  • Dual FIB/SEM systems significantly advance atom probe specimen preparation.
  • The described 'cut-out' and 'lift-out' techniques offer broad applicability.
  • These methods enhance the ability to perform site-specific analysis on challenging samples.