N Grennan-Heaven1, A Cerezo, T J Godfrey
1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3BH, UK. neil.grennan-heaven@materials.ox.ac.uk
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Improving ion mass resolution in scanning atom probe (SAP) analysis was achieved using post-deceleration techniques. This method enhanced data accuracy without requiring a reflectron lens, benefiting materials characterization.
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