Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Tandem Mass Spectrometry
Atomic Emission Spectroscopy: Instrumentation
Mass Analyzers: Common Types
Atomic Absorption Spectroscopy: Instrumentation
Electron Microscope Tomography and Single-particle Reconstruction
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jul 14, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
F Catoire1, E M Staicu-Casagrande, A Lahmam-Bennani
1Laboratoire des Collisions Atomiques et Moléculaires UMR 8625 and Fédération Lumière Matière, Bâtiment 351, Université de Paris-Sud XI, Orsay Cedex, France. fabrice.catoire@u-psud.fr
Researchers enhanced an electron spectrometer for triple coincidence detection in electron impact double ionization experiments. This upgrade significantly improves sensitivity for studying electron scattering and ejected electron dynamics.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: