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Published on: June 1, 2016
WSXM: a software for scanning probe microscopy and a tool for nanotechnology
I Horcas1, R Fernández, J M Gómez-Rodríguez
1Nanotec Electrónica S.L., Centro Empresarial Euronova 3, Ronda de Poniente 2, Edificio 2-1a Planta Oficina A, 28760 Tres Cantos, E-28049 Madrid, Spain.
Abstract:
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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