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Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Fiber-optical sensor with miniaturized probe head and nanometer accuracy based on spatially modulated low-coherence
Frank Depiereux1, Peter Lehmann, Tilo Pfeifer
1Fraunofer Institute for Production Technology, Steinbachstrasse 17, 52074 Aachen, Germany. f.depiereux@ipt.fraunhofer.de
Applied Optics
|May 22, 2007
Summary
This study presents a novel fiber-optical sensor for precise measurements. The developed system achieves nanometer accuracy by analyzing low-coherence interferograms, offering a flexible alternative to rigid optical systems.
Area of Science:
- Optics and Photonics
- Sensor Technology
- Interferometry
Background:
- Fiber-optical systems offer miniaturization and flexibility advantages over rigid optical setups.
- Low-coherence interferometry principles can be effectively implemented using fiber optics.
- Existing rigid systems may limit applications requiring compact or adaptable sensing probes.
Purpose of the Study:
- To develop and demonstrate a fiber-optical sensor based on spatially modulated low-coherence interferograms.
- To achieve nanometer measurement accuracy using advanced signal processing techniques.
- To validate the performance and accuracy of the developed fiber-optical sensor prototype.
Main Methods:
- Development of a fiber-optical sensor system comprising a sensing probe, broadband light source, and Michelson interferometer.
- Implementation of signal processing for analyzing spatially modulated low-coherence interferograms.
- Experimental validation of a system prototype to assess measurement accuracy.
Main Results:
- Successful development and realization of a fiber-optical sensor system.
- Demonstration of nanometer measurement accuracy through interferogram analysis.
- Experimental validation confirmed the high accuracy of the developed sensor.
Conclusions:
- The developed fiber-optical sensor effectively utilizes low-coherence interferometry for high-precision measurements.
- The system offers a flexible and miniaturized sensing solution.
- The validated prototype confirms the potential of this approach for various applications requiring nanometer accuracy.
