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Testing of large optical surfaces with subaperture stitching.

Shanyong Chen1, Shengyi Li, Yifan Dai

  • 1College of Mechatronic Engineering and Automation, National University of Defense Technology, Deya Road, Changsha, Hunan, China. shanyongchen@tom.com

Applied Optics
|May 22, 2007
PubMed
Summary

This study introduces strategies and a prototype for testing large optical surfaces using subaperture stitching. The subaperture stitching and localization (SASL) algorithm was adapted and validated for accurate large-surface metrology.

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Area of Science:

  • Optical engineering
  • Metrology
  • Surface testing

Background:

  • Traditional methods struggle with testing large optical surfaces.
  • Subaperture stitching offers a viable solution for high-precision measurements.
  • The subaperture stitching and localization (SASL) algorithm provides a foundation for this approach.

Purpose of the Study:

  • To present strategies for adapting the SASL algorithm for large optical surface testing.
  • To develop and validate a prototype system for subaperture stitching of large surfaces.
  • To demonstrate the feasibility of the proposed methods through experimental verification.

Main Methods:

  • Compensation strategies for interferometer lateral scale uncertainty were developed.
  • A coarse-fine stitching strategy was implemented for efficient stitching of numerous subapertures.
  • A prototype system with a kinematic model was built, accommodating up to 1 mm of linear motion uncertainty.

Main Results:

  • The developed strategies effectively address challenges in applying SASL to large surfaces.
  • The prototype system successfully performed subaperture stitching with high precision.
  • An experiment successfully stitched a spherical surface using 37 subapertures, validating the method.

Conclusions:

  • The adapted SASL algorithm and prototype are effective for testing large optical surfaces.
  • The coarse-fine stitching strategy enables efficient and accurate measurement of complex surfaces.
  • This approach offers a robust solution for metrology of large optical components.