Rui Ishiyama1, Shizuo Sakamoto, Johji Tajima
1Graduate School of Information Sciences, Tohoku University, Aramaki-Aza Aoba, Aoba-Ku, Sendai, Japan. r-ishiyama@bl.jp.nec.com
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This study introduces novel methods for precise 3D measurement using phase shift techniques. These advancements overcome limitations in absolute phase determination and phase unwrapping for complex surfaces, improving 3D scanning accuracy.
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