Ricardo García1, Robert Magerle, Ruben Perez
1Instituto de Microelectrónica de Madrid, CSIC, 28760 Tres Cantos, Madrid, Spain. rgarcia@imm.cnm.csic.es
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Phase-imaging force microscopy offers high-resolution surface analysis by measuring energy dissipation. This versatile technique reveals topography and material properties, advancing nanoscale research in diverse scientific fields.
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