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Detection of Architectural Distortion in Prior Mammograms via Analysis of Oriented Patterns
13:44

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Published on: August 30, 2013

Detecting wide lines using isotropic nonlinear filtering.

Laura Liu1, David Zhang, Jane You

  • 1Biometric Research Centre, Department of Computing, The Hong Kong Polytechnic University, Kowloon, Hong Kong. csliliu@comp.polyu.edu.hk

IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society
|June 6, 2007
PubMed
Summary
This summary is machine-generated.

This study introduces a new wide line detector that accurately identifies line thickness using an isotropic nonlinear filter. The method effectively extracts lines without derivatives, offering a novel approach to image analysis.

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Area of Science:

  • Computer Vision
  • Image Processing
  • Signal Processing

Background:

  • Line detection is vital for image analysis but existing methods often neglect line thickness.
  • Current algorithms primarily focus on line position, overlooking the importance of width in various applications.

Purpose of the Study:

  • To present a novel wide line detector capable of extracting lines along with their thickness.
  • To address the limitations of existing line detection algorithms by incorporating line width information.

Main Methods:

  • A novel wide line detector utilizing an isotropic nonlinear filter and circular masks.
  • The proposed method extracts lines without relying on directional derivatives, focusing on isotropic responses.
  • A framework for analyzing detector robustness and dynamically selecting parameters was developed.

Main Results:

  • The detector successfully extracts wide lines by leveraging nonlinear filtering and circular masks.
  • The relationship between circular mask size and detected line width was investigated.
  • Experimental results on diverse image samples validated the method's feasibility and effectiveness.

Conclusions:

  • The proposed isotropic nonlinear filter offers an effective solution for wide line detection, including thickness.
  • This approach provides a significant advancement over traditional derivative-based edge and line detectors.
  • The method demonstrates robustness and adaptability through dynamic parameter selection and mask size analysis.