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Detection of Architectural Distortion in Prior Mammograms via Analysis of Oriented Patterns
Published on: August 30, 2013
Laura Liu1, David Zhang, Jane You
1Biometric Research Centre, Department of Computing, The Hong Kong Polytechnic University, Kowloon, Hong Kong. csliliu@comp.polyu.edu.hk
This study introduces a new wide line detector that accurately identifies line thickness using an isotropic nonlinear filter. The method effectively extracts lines without derivatives, offering a novel approach to image analysis.
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