Rei Hobara1, Naoka Nagamura, Shuji Hasegawa
1Department of Physics, School of Science, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan. rei@surface.phys.s.u-tokyo.ac.jp
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Researchers developed a novel ultrahigh vacuum system combining a variable-temperature scanning tunneling microscope with four independent tips and a scanning electron microscope. This setup enables simultaneous atomic-resolution imaging and four-point probe conductivity measurements for advanced materials analysis.
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