Simultaneous scanning tunneling microscopy and stress measurements to elucidate the origins of surface forces

We have developed a new combined measurement system to investigate the underlying origins of forces on solid state surfaces from the viewpoint of atomic surface morphology. This system consists of two main parts: the measurements of force based on displacements and detailed atomic resolution observations of the surface morphology. The former involves a large sample cantilever and a capacitive detection method that provide sufficient resolution to detect changes of a few meV/atom or pN/atom at surfaces. For the latter, a scanning tunneling microscope was incorporated to observe structural changes occurring on the surface of the cantilever sample. Although this combined observation is not trivial, it was accomplished by carefully designing sample dimensions while suppressing the self-oscillation of the cantilever. To demonstrate the performance of this system a preliminary study of the room temperature adsorption of Br(2) on the clean Si(111)-7x7 surface is presented.