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Updated: Jul 14, 2026

Irradiator Commissioning and Dosimetry for Assessment of LQ α and β Parameters, Radiation Dosing Schema, and in vivo Dose Deposition

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Simple experimental method for alpha particle range determination in lead iodide films.

Yuri Dmitriev¹, Paul R Bennett, Leonard J Cirignano

¹Radiation Monitoring Devices Inc., Watertown, MA 02472, USA.

The Review of Scientific Instruments

|June 8, 2007

Summary

A new method using current-voltage (I-V) analysis determines alpha particle range in lead iodide (PbI2) films. This technique provides accurate measurements, aiding in understanding material interactions with radiation.

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Published on: September 27, 2018

Area of Science:

Materials Science
Nuclear Physics
Solid State Physics

Background:

Accurate determination of alpha particle range in thin films is crucial for radiation detection and material science.
Lead iodide (PbI2) is a promising material for radiation detectors, but its interaction with alpha particles requires further study.
Existing methods for range determination can be limited by film properties and analysis techniques.

Purpose of the Study:

To propose and validate a novel experimental method for determining the range of alpha particles in PbI2 films using I-V(s) analysis.
To investigate the influence of alpha particle radiation on the electrical properties (I-V curves) of PbI2 films.
To analyze the impact of film quality and radiation exposure on charge carrier concentration and surface defects.

Main Methods:

Utilized current-voltage (I-V) analysis to study alpha particle interactions with PbI2 films.
Employed analytical methods focusing on current density-electric field dependence and surface defect models.
Compared experimental range measurements with simulations from SRIM (Stopping and Range of Ions in Matter).

Main Results:

The experimental alpha particle range in PbI2 films was determined to be 30±5 microm, consistent with SRIM calculations (24 microm).
Alpha radiation exposure showed a tendency for I-V(s) to obey Ohm's law and improved dark resistivity and I-V shape in some films.
Successive measurements indicated a decrease in "surface defect" concentration, leading to "surface refining" and a weak decrease in charge carrier concentration.

Conclusions:

The I-V(s) analysis method is a viable technique for determining alpha particle range in PbI2 films.
Alpha particle irradiation can beneficially alter the electrical and surface properties of PbI2 films.
Understanding dark conductivity characteristics is essential to avoid overestimation of alpha particle range in PbI2.