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Multi-wavelength heterodyne-detected scattering-type scanning near-field optical microscopy
Jen-You Chu1, Tien-Jen Wang, You-Chia Chang
1Material and Chemical Research Laboratories, Industrial Technology Research Institute, Hsin-Chu 310, Taiwan, Republic of China.
Ultramicroscopy
|June 15, 2007
Abstract:
We report on the implementation of a scattering-type scanning near-field optical microscope based on a heterodyne detection scheme, which has the ability to record near-field optical images at multiple wavelengths simultaneously. It is used to map out local field distribution and to investigate the dispersion behavior of plasmon created by nanometer-scale metallic structures. It opens up an unprecedented opportunity to study nano-photonics.

