Search research articles

ABOUT JoVE

Overview Leadership Blog JoVE Help Center

AUTHORS

Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

LIBRARIANS

Testimonials Subscriptions Access Resources Library Advisory Board FAQ

RESEARCH

JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

EDUCATION

JoVE Core JoVE Business JoVE Science Education JoVE Lab Manual Faculty Resource Center Faculty Site

Terms & Conditions of Use

Related Concept Videos

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

Atomic Emission Spectroscopy: Instrumentation

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

Atomic Emission Spectroscopy: Lab

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by

Same author

Open-Path Cavity Ring-Down Spectroscopy for Simultaneous Detection of Hydrogen Chloride and Particles in Cleanroom Environment.

Sensors (Basel, Switzerland)·2024

Same author

Open-Path Laser Absorption Sensor for Mobile Measurements of Atmospheric Ammonia.

Sensors (Basel, Switzerland)·2023

Same author

Mobile Measurement System for the Rapid and Cost-Effective Surveillance of Methane and Volatile Organic Compound Emissions from Oil and Gas Production Sites.

Environmental science & technology·2020

Same author

Gas dynamics and vorticity generation in laser-induced breakdown of air.

Optics express·2020

Same author

Cavity Ring-Down Methane Sensor for Small Unmanned Aerial Systems.

Sensors (Basel, Switzerland)·2020

Same author

Open-path cavity ring-down methane sensor for mobile monitoring of natural gas emissions.

Optics express·2019

Search research articles

Related Experiment Video

Updated: Jul 14, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Differential sputter yield measurements using cavity ringdown spectroscopy.

Vijay Surla¹, Azer P Yalin

¹Department of Mechanical Engineering, Colorado State University, Fort Collins, Colorado 80523, USA.

|June 16, 2007

Summary

Cavity ringdown spectroscopy (CRDS) now measures sputter yield profiles. This technique, using spatial scanning and modeling, accurately characterizes particle distribution from sputtering targets.

More Related Videos

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization

Published on: August 6, 2018

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Published on: April 4, 2017

Related Experiment Videos

Last Updated: Jul 14, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization

Measurement of Ultrafast Vibrational Coherences in Polyatomic Radical Cations with Strong-Field Adiabatic Ionization

Published on: August 6, 2018

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Published on: April 4, 2017

Area of Science:

Physics
Materials Science
Spectroscopy

Background:

Cavity Ring-Down Spectroscopy (CRDS) is a sensitive absorption technique.
Measuring differential sputter yield profiles is crucial for understanding thin-film deposition and surface modification.
Previous methods for sputter yield profiling had limitations.

Purpose of the Study:

To report the first application of CRDS for measuring differential sputter yield profiles.
To develop and validate a method combining CRDS with spatial scanning and modeling for sputter yield analysis.

Main Methods:

Utilized CRDS by scanning the optical axis relative to the sputtered particle source.
Measured the spatial profile of CRDS signals.
Employed modeling techniques to invert the CRDS data and determine the differential sputter yield profile.

Main Results:

Successfully measured differential sputter yield profiles using CRDS.
Demonstrated the technique with 750 eV argon ions incident on a molybdenum target.
Observed an under-cosine sputtering distribution (alpha = 0.22 +/- 0.07), consistent with prior quartz crystal microbalance measurements.

Conclusions:

CRDS is a viable and effective method for characterizing differential sputter yield profiles.
The developed CRDS-based approach provides accurate insights into particle distribution during sputtering.
This technique advances the understanding of sputtering processes relevant to materials science and thin-film technologies.