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Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
Published on: November 28, 2014
L Portes1, M Ramonda, R Arinero
1Institut d'Electronique du Sud (IES), UMR CNRS 5214, CC 082, France.
Researchers observed electrostatic force gradients using amplitude-controlled Atomic Force Microscopy (AFM) and a double-pass method. This technique enables parallel surface voltage or Kelvin imaging alongside morphology, achieving millivolt-level noise.
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