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Related Concept Videos

UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
Atomic Absorption Spectroscopy: Radiation and Light Sources01:13

Atomic Absorption Spectroscopy: Radiation and Light Sources

Atomic absorption spectroscopy (AAS) relies on the Beer-Lambert law, which requires that the radiation source emits a narrow range of wavelengths to match the absorption characteristics of the analyte atom. The primary criteria for choosing an appropriate radiation source in AAS is to provide a precise and intense emission at specific wavelengths that will allow accurate detection of the analyte.
Two common narrow-range 'line' sources used in AAS are hollow-cathode lamps (HCLs) and...
Atomic Absorption Spectroscopy: Instrumentation01:22

Atomic Absorption Spectroscopy: Instrumentation

An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
The atomizer used in AAS can be either a flame atomizer or an...
Atomic Absorption Spectroscopy: Lab01:21

Atomic Absorption Spectroscopy: Lab

For AAS measurements, samples must be introduced as clear solutions, often requiring extensive preliminary treatment to dissolve materials like soils, animal tissues, and minerals. Common methods for sample preparation include treatment with hot mineral acids, wet ashing, combustion in closed containers, high-temperature ashing, or fusion with reagents.
 Solutions containing organic solvents, such as low-molecular-mass alcohols, esters, or ketones, enhance absorbances by increasing nebulizer...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
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Variable rowland radius laboratory vacuum surface-sensitive x-ray absorption fine structure spectrometer.

Yu N Yuryev1, Hwack-Joo Lee, Hyun-Min Park

  • 1Korea Research Institute of Standards and Science, RO. Box 102, Yuseong, Daejeon 305-600, Korea.

The Review of Scientific Instruments
|June 21, 2007
PubMed
Summary

A new laboratory x-ray spectrometer enables surface-sensitive extended x-ray absorption fine structure (SEXAFS) and X-ray absorption near-edge structure (XANES) measurements. This advanced instrument achieves high photon flux and energy resolution for detailed surface analysis.

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Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
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Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

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Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2
11:27

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

Published on: December 8, 2016

Area of Science:

  • Materials Science
  • Surface Science
  • Spectroscopy

Background:

  • Surface analysis techniques are crucial for understanding material properties at the nanoscale.
  • Existing X-ray absorption spectroscopy methods often lack the required surface sensitivity for thin films and interfaces.

Purpose of the Study:

  • To develop and describe a novel laboratory X-ray spectrometer optimized for surface-sensitive measurements.
  • To enable high-resolution SEXAFS and XANES analyses with enhanced sensitivity.

Main Methods:

  • Utilized a rotating anode X-ray generator and a computer-controlled monochromator with exchangeable curved crystals.
  • Implemented a vacuum-enclosed beamline and sophisticated scanning modes for precise sample positioning.
  • Employed proportional counters for bulk measurements and channeltrons for surface-sensitive photoelectron detection.

Main Results:

  • Achieved a photon flux of 2.5 x 10^5 counts/s at the Cu K edge with ~5 eV energy resolution.
  • Demonstrated high near-surface sensitivity through EXAFS spectra of 3 nm Cu and Hf oxide films.

Conclusions:

  • The new spectrometer provides a versatile and sensitive platform for laboratory-based surface X-ray spectroscopy.
  • The instrument is capable of detailed characterization of thin films and surface layers.