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Updated: Jul 14, 2026

A Novel Technique for Raman Analysis of Highly Radioactive Samples Using Any Standard Micro-Raman Spectrometer
Published on: April 12, 2017
PRAXIS--combined mu-Raman and mu-XRF spectrometers in the examination of forensic samples
Janina Zieba-Palus1, Rafał Borusiewicz, Marcin Kunicki
1Institute of Forensic Research, Westerplatte 9, 31-033, Cracow, Poland. jzieba@ies.krakow.pl
Abstract:
Recently, two analytical techniques--Raman and XRF spectroscopy--have been often applied in criminalistic examinations of different kinds of trace evidences. In this paper, the application of the new combined mu-Raman and mu-XRF spectrometer in analysis of multilayer paint chips, modern inks, plastics and fibres was evaluated. It was ascertained that the apparatus possesses real advantages and could be helpful in the identification of examined materials after some modifications, i.e. by adding an extra laser and decreasing the spot size of the X-ray beam.
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