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A Multimodal Wide-Field Fourier-Transform Raman Microscope

A Multimodal Wide-Field Fourier-Transform Raman Microscope

Published on: December 30, 2025

Fast line-shape correction procedure for imaging Fourier-transform spectrometers.

Simon A Roy¹, Simon Potvin, Jérôme Genest

¹Centro d'optique, photonique et laser, Université Laval, Québec, Canada. roy@gel.ulaval.ca

|July 5, 2007

Summary

A new method corrects instrument line shapes in imaging Fourier-transform spectrometers (IFTS). This enables direct spectral feature comparison across pixels, improving data accuracy for applications using infrared CCD cameras.

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Area of Science:

Spectroscopy
Optical Engineering
Instrument Calibration

Background:

Imaging Fourier-transform spectrometers (IFTS) are increasingly used with affordable infrared CCD cameras.
Accurate spectral analysis requires correction for instrument line-shape variations across pixels.
Existing methods can be computationally intensive.

Purpose of the Study:

To demonstrate an efficient instrument line-shape correction method for IFTS.
To enable direct comparison of spectral features (e.g., emission/absorption lines) between pixels.
To leverage matrix line-shape integration for computational speed.

Main Methods:

Developed a method to calibrate all pixels onto a common spectral grid.
Utilized matrix line-shape integration formalism for computational efficiency.
Employed a monochromatic source to characterize and correct spectral shifts in each pixel's interferogram.

Main Results:

Successfully calibrated pixels to a unified spectral grid.
Achieved a direct comparison of spectral features across different pixels.
Demonstrated computational speed gains over pixel-by-pixel inversion methods.

Conclusions:

The presented line-shape correction method is effective for IFTS.
This technique enhances the comparability of spectral data from IFTS instruments.
The method supports the integration of new infrared CCD technologies in spectroscopy.