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GaN-based distributed Bragg reflector for high-brightness LED and solid-state lighting.

Dong-Xue Wang1, Ian T Ferguson, John A Buck

  • 1School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, 30332, USA. michael.d.wang@motorola.com

Applied Optics
|July 5, 2007
PubMed
Summary
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A new numerical model simulates distributed Bragg reflectors (DBRs) using thin-film optics. It predicts DBR performance considering material properties and structural variations for different light polarizations.

Area of Science:

  • Optics and Photonics
  • Materials Science

Background:

  • Distributed Bragg reflectors (DBRs) are crucial optical components.
  • Accurate modeling of DBRs is essential for device optimization.

Purpose of the Study:

  • To develop a comprehensive numerical model for DBRs based on thin-film optics.
  • To incorporate detailed refractive-index calculations for relevant semiconductor materials.

Main Methods:

  • Development of a numerical model utilizing thin-film optics principles.
  • Inclusion of refractive-index calculations for Gallium Nitride (GaN), Aluminum Nitride (AlN), Aluminum Gallium Nitride (AlGaN), and Indium Gallium Nitride (InGaN).

Main Results:

  • The model accurately predicts DBR performance.

Related Experiment Videos

  • Performance predictions account for refractive-index variations and layer-thickness fluctuations.
  • The model analyzes the impact of the number of quarter-wave stack pairs and light polarization.

    • Conclusions:

    • The developed numerical model provides a versatile tool for DBR design and analysis.
    • It enables the prediction of DBR performance under various real-world conditions.
    • This model supports the optimization of DBRs for specific optical applications.