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Updated: Jul 13, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
06:46

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

Published on: August 25, 2016

Development of advanced x-ray imaging crystal spectrometer utilizing a large area segmented proportional counter for

S G Lee1, J G Bak, U W Nam

  • 1National Fusion Research Center, Taejeon 305-333, Korea. sglee@nfrc.re.kr

The Review of Scientific Instruments
|July 7, 2007
PubMed

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