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Epitaxial Nanostructured α-Quartz Films on Silicon: From the Material to New Devices

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The analysis of quartz c-axis fabrics using a modified optical microscope.

C J L Wilson¹, D S Russell-Head, K Kunze

¹School of Earth Sciences, The University of Melbourne, Victoria, 3010, Australia.

Journal of Microscopy

|July 20, 2007

Summary

A new microfabric analyzer (MiFA) rapidly collects spatial c-axis orientation data from polarized light images. This automated system enables detailed crystal orientation analysis in geological samples, improving fabric studies.

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Area of Science:

Geology
Materials Science
Crystallography

Background:

Accurate crystal orientation data is crucial for understanding material properties and geological processes.
Traditional methods for collecting c-axis orientation data can be time-consuming and labor-intensive.

Purpose of the Study:

To introduce a novel, fully automated microfabric analyzer (MiFA) for rapid, high-resolution spatial c-axis orientation data collection.
To demonstrate the system's capability for detailed fabric analysis in geological thin sections.

Main Methods:

Development and application of the automated microfabric analyzer (MiFA).
Utilizing digital polarized light microscopy to capture images.
Employing axial-distribution diagrams (AVA) for initial analysis and c-axis pole figure generation.
Interactive and grid array selection of measurement sites.
Verification process to exclude erroneous data points.

Main Results:

The MiFA system allows for fast collection of high-resolution spatial c-axis orientation data.
Users can generate c-axis pole figures from selected areas of interest and create bulk fabric diagrams.
Comparison with X-ray texture goniometry and electron backscatter diffraction (EBSD) validates MiFA measurements.
Precise linking of crystal orientations to specific locations within individual grains was demonstrated.

Conclusions:

The MiFA provides an efficient and accurate method for analyzing crystal orientation fabrics.
The system enhances the study of geological materials by enabling detailed, location-specific crystallographic analysis.
MiFA facilitates a deeper understanding of structure-property relationships in crystalline materials.