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Shear stress measurements on InAs nanowires by AFM manipulation

Michael Bordag1, Aline Ribayrol, Gabriela Conache

  • 1Institute for Theoretical Physics, Leipzig University, Postbox 100 920, 04009 Leipzig, Germany. Michael.Bordag@itp.uni-leipzig.de

Small (Weinheim an Der Bergstrasse, Germany)
|July 28, 2007
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...