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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.7K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.7K
Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Related Experiment Video

Updated: Mar 21, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
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Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope

Published on: February 28, 2019

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Print your atomic force microscope.

Ferdinand Kühner1, Robert A Lugmaier, Steffen Mihatsch

  • 1Applied Physics and Center for Nano Science, Ludwig-Maximilians Universität München, München 80799, Germany. ferdinand.kuehner@physik.uni-muenchen.de

The Review of Scientific Instruments
|August 4, 2007
PubMed
Summary
This summary is machine-generated.

Rapid prototyping enables custom atomic force microscopy (AFM) head manufacturing. 3D printed AFM heads show comparable performance to traditional ones, offering design freedom for specialized applications.

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Instrumentation

Background:

  • Conventional milling limits complex designs in scanning probe microscopy.
  • Rapid prototyping techniques like 3D printing allow intricate structures.

Purpose of the Study:

  • To manufacture an atomic force microscopy (AFM) head using rapid prototyping.
  • To compare the performance of a 3D printed AFM head against a conventionally milled one.

Main Methods:

  • Utilized layer-by-layer additive manufacturing (3D printing) to create an AFM head.
  • Performed single molecule force spectroscopy (SMFS) to test AFM head performance.
  • Compared signal-to-noise ratio and thermal drift between printed and milled AFM heads.

Main Results:

  • 3D printed and milled AFM heads exhibited similar signal-to-noise ratios.
  • Thermal drift was comparable between the two types of AFM heads.
  • The material's lower elastic modulus was offset by higher damping, suitable for low-noise applications.

Conclusions:

  • 3D printing offers significant design freedom for creating custom AFM instruments.
  • Rapid production of application-tailored AFM heads is achievable.
  • Additive manufacturing is a viable technique for producing high-performance AFM heads.