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Updated: Jul 13, 2026
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Synthesis and Microdiffraction at Extreme Pressures and Temperatures
Published on: October 7, 2013
Thickness measurement of sample in diamond anvil cell
Ming Li1, Chunxiao Gao, Gang Peng
1State Key Laboratory for Superhard Materials, Institute of Atomic and Molecular Physics, Jilin University, Changchun 130012, People's Republic of China.
The Review of Scientific Instruments
|August 4, 2007
Abstract:
We report on an original method that measures sample thickness in a diamond anvil cell under high pressures. The method is based on two hypotheses: completely plastic deformation on the gasket and completely elastic deformation of the diamonds. This method can further eliminate the effect of diamond deformation on the thickness measurement of a sample, which permits us to measure the thickness of alumina up to 41.4 GPa.
