Low EOF rate measurement based on constant effective mobility in microchip CE

A new method for quickly determining low EOF rates (micro(EOF)) in microchip CE is described. The measurement is based on the notion that the effective mobility (micro(eff)) of an analyte is a constant in a certain BGE. The micro(eff) of an analyte is determined in a reference fast-electroosmosis microchip, and the apparent mobility (micro(app)) of the analyte can be determined in the microchip with unknown low electroosmosis, and then micro(EOF) in the low-electroosmosis microchip can be calculated according to the equation mu(EOF) = micro(app) - micro(eff). By an indirect method or other conventional methods, micro(eff) can be easily measured in the reference microchip. The proposed method is particularly useful for low-electroosmosis measurements in wall-modified microchannels.