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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

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Probing atomic displacements with thermal differential EXAFS.

M P Ruffoni¹, R F Pettifer, S Pascarelli

¹Department of Physics, University of Warwick, Coventry CV4 7AL, UK. ruffoni@esrf.fr

Journal of Synchrotron Radiation

|August 25, 2007

Summary

Differential extended X-ray absorption fine structure (DiffEXAFS) measures atomic strain. This study demonstrates DiffEXAFS for thermal strain, achieving high sensitivity to atomic displacements.

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Area of Science:

Materials Science
Condensed Matter Physics
Analytical Chemistry

Background:

Accurate measurement of atomic strain is crucial for understanding material properties.
Novel techniques are needed to probe small atomic displacements with high precision.

Purpose of the Study:

To develop and validate Differential Extended X-ray Absorption Fine Structure (DiffEXAFS) for measuring thermally induced strain.
To assess the sensitivity of DiffEXAFS to minute atomic displacements.

Main Methods:

Application of DiffEXAFS technique to alpha-Fe and SrF(2) samples.
Measurement of thermally induced strain using DiffEXAFS.
Analysis of atomic displacements with femtometer precision.

Main Results:

Thermal DiffEXAFS measurements yielded coefficients of thermal expansion for alpha-Fe and SrF(2) in good agreement with accepted values.
The technique demonstrated sensitivity to mean atomic displacements as small as 0.3 fm.
Validation of DiffEXAFS for quantitative analysis of thermal strain.

Conclusions:

DiffEXAFS is a viable and highly sensitive technique for measuring thermally induced atomic strain.
The developed method opens new avenues for studying lattice dynamics and material behavior under thermal stress.
High precision in measuring atomic displacements is achievable with DiffEXAFS.