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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Probing atomic displacements with thermal differential EXAFS

M P Ruffoni1, R F Pettifer, S Pascarelli

  • 1Department of Physics, University of Warwick, Coventry CV4 7AL, UK. ruffoni@esrf.fr

Journal of Synchrotron Radiation
|August 25, 2007
PubMed

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