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Related Concept Videos

Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Atomic spectroscopy is a vital tool in elemental analysis, both qualitatively and quantitatively. It can be broadly divided into optical spectroscopy, mass spectroscopy, and X-ray spectroscopy methods. The optical spectroscopic methods are atomic absorption spectroscopy (AAS), atomic emission spectroscopy (AES), and atomic fluorescence spectroscopy (AFS). The first step in all three methods is atomization, where the solid, liquid, or solution-phase samples are converted into gas-phase atoms and...
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Related Experiment Video

Updated: Jul 9, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

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Published on: July 27, 2018

True atomic resolution by atomic force microscopy through repulsive and attractive forces.

F Ohnesorge, G Binnig

    Science (New York, N.Y.)
    |June 4, 1993
    PubMed
    Summary
    This summary is machine-generated.

    Atomic Force Microscopy revealed atomic details of calcite cleavage planes in water. This study achieved true atomic resolution, identifying defects and measuring interatomic forces for enhanced surface analysis.

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    Picometer-Precision Atomic Position Tracking through Electron Microscopy
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    Picometer-Precision Atomic Position Tracking through Electron Microscopy

    Published on: July 3, 2021

    Area of Science:

    • Materials Science
    • Surface Science
    • Nanotechnology

    Background:

    • Understanding crystal surfaces at the atomic level is crucial for predicting material properties and behaviors.
    • Calcite (calcium carbonate) is a common mineral with important geological and industrial applications.
    • Previous investigations of calcite cleavage planes lacked true atomic-scale resolution in aqueous environments.

    Purpose of the Study:

    • To investigate the (1014) cleavage plane of calcite using Atomic Force Microscopy (AFM) in an aqueous environment.
    • To achieve and demonstrate true lateral atomic-scale resolution on the calcite surface.
    • To characterize atomic-scale features, including step lines and defects, and measure interatomic forces.

    Main Methods:

    • Atomic Force Microscopy (AFM) was employed to image the calcite (1014) cleavage plane.
    • Experiments were conducted in deionized water at room temperature to mimic natural conditions.
    • High-resolution imaging and force measurements were performed to analyze surface topography and interactions.

    Main Results:

    • True lateral atomic-scale resolution was successfully achieved on the calcite (1014) surface.
    • Atomic-scale periodicities and the relative positions of atoms within the unit cell were accurately determined.
    • Atomic-scale kinks, identified as point-like defects along monoatomic step lines, were resolved.
    • Attractive forces on the order of 10^-11 N between sample atomic sites and the AFM tip were directly measured.

    Conclusions:

    • AFM in water provides unparalleled atomic-scale resolution for well-ordered surfaces like calcite.
    • The study successfully identified atomic-scale defects and measured interatomic forces, validating the technique.
    • This high-resolution imaging and force measurement capability offers a reliable method for surface analysis and defect characterization.