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Updated: Jul 9, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
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Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

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True atomic resolution by atomic force microscopy through repulsive and attractive forces

F Ohnesorge, G Binnig

    Science (New York, N.Y.)
    |June 4, 1993
    PubMed

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