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Determination of pattern centre in EBSD using the moving-screen technique
D A Carpenter1, J L Pugh, G D Richardson
1Technology Development Organization, Y-12 National Security Complex, Oak Ridge, TN 37831-8084, USA. carpenterda@y12.doe.gov
Journal of Microscopy
|September 1, 2007
Summary
A new high-precision calibration technique for electron backscatter diffraction (EBSD) was developed. This method requires no prior crystallographic knowledge or initial parameter estimates, simplifying the calibration process.
Area of Science:
- Materials Science
- Crystallography
- Electron Microscopy
Background:
- Electron Backscatter Diffraction (EBSD) is a crucial technique for analyzing material microstructures.
- Accurate calibration of EBSD systems is essential for reliable crystallographic analysis.
- Existing calibration methods often require prior crystallographic knowledge and initial parameter estimations.
Purpose of the Study:
- To reformulate the 'moving-screen' or 'pattern magnification' method for EBSD calibration.
- To develop a high-precision EBSD calibration technique.
- To eliminate the need for specimen crystallographic knowledge and initial calibration parameter estimates.
Main Methods:
- The study reformulated the 'moving-screen'/'pattern magnification' calibration method.
- The technique relies on the precise displacement of the screen and camera assembly.
- Corresponding points were interactively selected from EBSD patterns.
Main Results:
- A high-precision EBSD calibration technique was developed.
- The new method does not require prior crystallographic information about the specimen.
- The technique eliminates the need for initial estimates of calibration parameters.
Conclusions:
- The reformulated EBSD calibration method offers high precision without requiring crystallographic knowledge.
- Accurate displacement of the screen and camera assembly is key to the technique's success.
- Automated routines could be achieved by selecting points from Hough transform analysis.
