D A Carpenter1, J L Pugh, G D Richardson
1Technology Development Organization, Y-12 National Security Complex, Oak Ridge, TN 37831-8084, USA. carpenterda@y12.doe.gov
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A new high-precision calibration technique for electron backscatter diffraction (EBSD) was developed. This method requires no prior crystallographic knowledge or initial parameter estimates, simplifying the calibration process.
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