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The interpretation of indexing of high Sigma CSL grain boundaries from ceramics
Shao-Ju Shih1, Myung-Beom Park, David J H Cockayne
1Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, United Kingdom.
Abstract:
Electron backscatter diffraction (EBSD) is a useful technique for measuring the orientation of individual grains and for determining grain boundary misorientations in polycrystals. However, its application to ceramics is more difficult than to metals, because the surface quality that can be achieved often makes the Kikuchi patterns blurred. As a consequence, it can be difficult, even for automated systems, to differentiate between different grain orientations, which have similar patterns. In this paper, we carry out EBSD analyses of SrTiO(3) polycrystalline material prepared with different polishing methods, and we consider the effect of different criteria in interpreting the EBSD patterns from them. In particular, we investigate the CSL statistics using both the Palumbo and Aust and the Brandon criteria in this situation.

