Magnetic resonance force microscopy combined with surface topography.

S Tsuji1, Y Yoshinari, E Kawai

  • 1Advanced Technology Division, JEOL Ltd, 3-1-2 Musashino, Akishima, Tokyo, Japan. stsuji@jeol.co.jp

Summary

This study introduces a novel surface microscopy technique combining magnetic resonance force microscopy (MRFM) and scanning force microscopy (SFM) for microscale object identification. The method achieves high spatial resolution, paving the way for subsurface material anomaly detection.

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