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Updated: Jul 12, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
Elemental sensitivity in soft x-ray imaging with a laser-plasma source and a color center detector
F Calegari1, G Valentini, C Vozzi
1National Laboratory for Ultrafast and Ultraintense Optical Science, CNR-INFM, Politecnico, Milan, Italy.
Abstract:
Elemental sensitivity in soft x-ray imaging of thin foils with known thickness is observed using an ultrafast laser-plasma source and a LiF crystal as detector. Measurements are well reproduced by a simple theoretical model. This technique can be exploited for high spatial resolution, wide field of view imaging in the soft x-ray region, and it is suitable for the characterization of thin objects with thicknesses ranging from hundreds down to tens of nanometers.
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