A frequency-based approach to locate common structure for 2D-3D intensity-based registration of setup images in

Reshma Munbodh1, Zhe Chen, David A Jaffray

  • 1Department of Electrical Engineering, Yale University, New Haven, Connecticut 06520, USA. munbodhr@mskcc.org

Medical Physics
|September 8, 2007
PubMed

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