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Published on: August 10, 2019
Image-formation technique for scanning electron microscopy and electron probe microanalysis
Abstract:
A technique is described for topographic images on the scanning electron microscope and the scanning electron probe microanalyzer. In this technique, the brightness of the oscilloscope is modulated by a signal obtained by mixing the signal (from secondary electrons or targets current) with its first derivative. This enhances minor topographic features which are poorly reproduced in the technique.
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