A quantitative analysis of the cone-angle dependence in precession electron diffraction

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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
07:24

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

J Ciston1, B Deng, L D Marks

  • 1Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA. j-ciston@northwestern.edu

Ultramicroscopy
|September 15, 2007
PubMed

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