Experimental technique for reducing contact and background noise in voltage spectral density measurements

Electric noise measurements can give useful information on the conduction mechanisms and the dynamic behaviors of the charge carriers in new materials. However, it is well known that not all the electronic fluctuations are originated from the material itself, but some noise sources depend on the experimental procedures used for the measurements. In this article, an experimental technique to reduce "external" noise components, not associated with the bulk system, is presented. The proposed method is based on measurements of the voltage spectral density, using in sequence a four- and a two-probe technique. From the measurements it is possible to evaluate the contact and the background noise contributions and to recover the real spectral trace of the sample. The proposed procedure is demonstrated to be valid in spectral density measurements performed on La(0.7)Sr(0.3)MnO(3) thin films.