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Sialolith characterization by scanning electron microscopy and X-ray photoelectron spectroscopy

C Bahadir Giray1, Meral Dogan, Ayse Akalin

  • 1Department of Oral Surgery, Faculty of Dentistry, Hacettepe University, Ankara, Turkey.

Scanning
|October 6, 2007
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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