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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
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Dielectric metamaterials based on electric and magnetic resonances of silicon carbide particles

Jon A Schuller1, Rashid Zia, Thomas Taubner

  • 1Geballe Laboratory for Advanced Materials, 476 Lomita Mall, Stanford, California 94305, USA.

Physical Review Letters
|October 13, 2007
PubMed

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