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Coherent range-gated laser displacement metrology with compact optical head
O P Lay1, S Dubovitsky, D A Shaddock
1Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109, USA. oliver.p.lay@jpl.nasa.gov
We developed a compact laser displacement metrology system using random noise modulation for precise measurements. This new architecture achieves 1.1 nm resolution, enabling easier integration and multiplexing of sensors.
Area of Science:
- Optics and Photonics
- Metrology and Measurement Science
Background:
- Traditional laser displacement sensors often have bulky optical heads.
- Integrating and multiplexing numerous sensors can be complex and costly.
Purpose of the Study:
- To introduce a novel, compact architecture for laser displacement metrology.
- To demonstrate a significant reduction in optical head size and complexity.
- To enable easier integration and multiplexing of sensor arrays.
Main Methods:
- Modulating outgoing laser light with a binary random noise code.
- Discriminating detected signals based on their unique propagation delay.
- Utilizing a single optical fiber for compact head connectivity.
Main Results:
- Achieved a displacement resolution of 1.1 nanometers root mean square (nm rms).
- Demonstrated a drastic reduction in the size and complexity of the optical head.
- Showcased the ease of integration and multiplexing capabilities for multiple sensors.
Conclusions:
- The developed architecture offers a significant advancement in laser displacement metrology.
- The compact and multiplexable design is suitable for large-scale sensor applications.
- The random noise modulation technique enables high-resolution, efficient displacement sensing.
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