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Updated: Jul 10, 2026
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Atomic Force Microscopy Combined with Infrared Spectroscopy as a Tool to Probe Single Bacterium Chemistry
Published on: September 15, 2020
Combined in situ atomic force microscopy-infrared-attenuated total reflection spectroscopy
Martin Brucherseifer1, Christine Kranz, Boris Mizaikoff
1School of Chemistry and Biochemistry, Georgia Institute of Technology, Atlanta, Georgia 30032-0400, USA.
Analytical Chemistry
|October 18, 2007
Summary
This study introduces a novel combined atomic force microscopy (AFM) and infrared attenuated total reflection (IR-ATR) spectroscopy technique. This method allows simultaneous high-resolution surface imaging and chemical analysis in liquid environments.
Area of Science:
- Surface science
- Spectroscopy
- Nanotechnology
Background:
- Atomic force microscopy (AFM) provides high-resolution topographical imaging.
- Infrared attenuated total reflection (IR-ATR) spectroscopy offers chemical information.
- Simultaneous surface imaging and chemical analysis in liquids have been limited.
Purpose of the Study:
- To present a combined AFM-IR-ATR setup for simultaneous measurements.
- To demonstrate the technique's capability for in situ surface modification studies.
- To enable simultaneous topographical and chemical analysis in liquid environments.
Main Methods:
- Coupling AFM with IR-ATR spectroscopy.
- Utilizing evanescent field absorption for spectroscopy.
- Performing in situ measurements in liquid solutions.
Main Results:
- Demonstrated simultaneous AFM imaging and IR-ATR spectroscopy.
- Successfully imaged the dissolution of urea with nanometer resolution.
- Correlated topographical changes with bulk spectral shifts.
Conclusions:
- The combined AFM-IR-ATR technique enables simultaneous surface imaging and chemical analysis in liquids.
- This method allows for in situ monitoring of surface modification processes.
- Future applications include kinetic studies of surface processes with chemical specificity.
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