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Updated: Jul 10, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

A surface-tailored, purely electronic, mott metal-to-insulator transition

R G Moore1, Jiandi Zhang, V B Nascimento

  • 1Department of Physics and Astronomy, University of Tennessee, Knoxville, TN 37996, USA.

Science (New York, N.Y.)
|October 27, 2007
PubMed

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