Dukhyun Choi1, Woonbong Hwang, Euisung Yoon
1Department of Mechanical Engineering, Pohang University of Science and Technology, San 31, Hyoja Dong, Nam-gu, Pohang, Kyungbuk 790-784, Korea.
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A new atomic force microscopy (AFM) calibration method simplifies lateral force measurement using an angle conversion factor. This factor allows accurate calibration of any rectangular cantilever without repeat experiments, enhancing reliability.
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