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Atomic Force Microscopy

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Spectral Reflectometric Microscopy on Myelinated Axons In Situ

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Published on: July 2, 2018

Spectral self-interference microscopy for low-signal nanoscale axial imaging.

Brynmor J Davis¹, Anna K Swan, M Selim Unlü

¹Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, 405 North Mathews Avenue, Urbana, Illinois 61801, USA. bryn@uiuc.edu

Journal of the Optical Society of America. A, Optics, Image Science, and Vision

|November 3, 2007

Summary

Spectral self-interference microscopy (SSM) advancements enable low-signal imaging for single-molecule studies. New methods demonstrate nanometer axial localization and robust data processing for broader SSM applications.

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Area of Science:

Optics and Photonics
Biophysics
Spectroscopy

Background:

Spectral Self-Interference Microscopy (SSM) offers unique capabilities for nanoscale imaging.
Current limitations hinder SSM application in low-light conditions, such as single-molecule detection.

Purpose of the Study:

To expand the applicability of SSM, particularly for low-signal environments like single-molecule studies.
To develop a comprehensive theoretical and numerical framework for SSM.

Main Methods:

Developed a comprehensive electromagnetic model for SSM accommodating various experimental parameters.
Investigated an evanescently excited SSM system using Monte Carlo simulations.
Proposed a noise-robust data-processing method for spectral envelope uncertainties.

Main Results:

Demonstrated nanometer-scale axial localization for single-emitter objects in low-signal conditions.
Successfully imaged arbitrary fluorophore distributions and two-emitter objects.
Validated the robustness of the data-processing method against noise.

Conclusions:

The enhanced SSM framework significantly broadens its application scope.
Achieved high-precision localization and imaging in challenging low-signal scenarios.
The developed methods pave the way for advanced SSM applications in biophysics and materials science.