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Updated: Jul 10, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
M R Astley1, M Kataoka, C J B Ford
1Cavendish Laboratory, University of Cambridge, J.J. Thomson Avenue, Cambridge CB3 0HE, United Kingdom.
Electron escape rates from dynamic quantum dots (QDs) were measured. Tunneling rates varied significantly with gate voltage and electron number, yielding Coulomb addition energies comparable to static QDs.
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