Critical scaling in standard biased random walks

C Anteneodo1, W A M Morgado

  • 1Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro, CP 38097, 22453-900, Rio de Janeiro, Brazil. celia@fis.puc-rio.br

Physical Review Letters
|November 13, 2007
PubMed
Summary

This study reveals a critical phenomenon in a simple 1D random walk model. The fragmented coverage and crack distribution exhibit fractal properties near a critical point.

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