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Noncontact atomic force microscopy of perfect single crystals of pentacene prepared by crystallization from solution

Kazuya Sato1, Takahiro Sawaguchi, Masafumi Sakata

  • 1Department of Applied Chemistry, Graduate School of Engineering, Tohoku University, 6-6-07 Aoba, Sendai 980-8579, Japan.

Langmuir : the ACS Journal of Surfaces and Colloids
|November 16, 2007
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...