Novel attenuated total reflection Fourier transform infrared microscopy using a gem quality diamond as an internal

Sanong Ekgasit1, Pimthong Thongnopkun

  • 1Sensor Research Unit, Department of Chemistry, Faculty of Science, Chulalongkorn University, Bangkok 10330, Thailand.

Applied Spectroscopy
|November 22, 2007
PubMed
Summary

A new sharp-tipped diamond internal reflection element (IRE) enables attenuated total reflection Fourier transform infrared (ATR FT-IR) spectral acquisition. This novel diamond IRE method offers a promising alternative for material analysis using infrared microscopy.

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