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Active particle control through silicon using conventional optical trapping techniques.

David C Appleyard1, Matthew J Lang

  • 1Department of Biological Engineering, MIT NE47-263, 77 Massachusetts Ave., Cambridge, MA 02139, USA.

Lab on a Chip
|November 22, 2007
PubMed
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Optical trapping now works on silicon surfaces, enabling precise manipulation and tracking of cells and particles. This advancement integrates optical tools with semiconductor environments for new applications.

Area of Science:

  • Biophysics
  • Nanotechnology
  • Optical Engineering

Background:

  • Conventional optical trapping is limited to transparent substrates.
  • Integrating optical manipulation with semiconductor surfaces presents unique challenges.
  • Silicon substrates are widely used in microfluidics and electronics.

Purpose of the Study:

  • To demonstrate the functional integration of optical trapping with silicon surfaces.
  • To enable manipulation, tracking, and positioning of particles and cells on silicon.
  • To explore new applications in microfluidics and single-molecule measurements.

Main Methods:

  • Utilizing near-infrared trapping lasers and reflective imaging.
  • Implementing standard optical trap calibration, positioning, and tracking techniques.

Related Experiment Videos

  • Adapting conventional optical trapping instruments with minimal modifications.

    • Main Results:

    • Achieved object control and measurement capabilities comparable to glass substrates.
    • Identified silicon substrate transmission efficiency as the primary factor affecting trap stiffness.
    • Successfully demonstrated control of multiple cells and complex non-spherical objects on silicon wafers.

    Conclusions:

    • Optical trapping can be effectively integrated with silicon surfaces.
    • This technique offers a versatile platform for advanced microfluidic control and precision measurements.
    • The method is adaptable for various biological and non-biological applications on semiconductor substrates.