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Updated: Jul 9, 2026
08:41
Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution
Published on: August 16, 2012
Microscopic tomography with ultra-HVEM and applications.
Akio Takaoka1, Toshiaki Hasegawa, Kiyokazu Yoshida
1Research Center for Ultra-HVEM, Osaka University, Mihogaoka 7-1, Ibaraki, Osaka, Japan. takaoka@uhvem.osaka-u.ac.jp
Ultramicroscopy
|November 27, 2007
Summary
The 3 MV ultra-high voltage electron microscope (UHVEM) enables high-resolution 3D imaging of thick biological and silicon device samples. This advanced electron tomography technique offers significant improvements for various scientific fields.
Area of Science:
- Materials Science
- Biotechnology
- Electrical Engineering
Background:
- High-resolution imaging of thick specimens is challenging for conventional electron microscopes.
- Electron tomography requires advanced microscopy techniques for detailed 3D reconstruction.
Purpose of the Study:
- To introduce the capabilities of the 3 MV ultra-high voltage electron microscope (UHVEM) for electron tomography.
- To detail key aspects of UHVEM tomography, including magnification, image blurring, and staining methods.
Main Methods:
- Utilizing a 3 MV ultra-high voltage electron microscope (UHVEM) for imaging.
- Acquiring images of 5-micrometer-thick biological slices tilted up to 70 degrees.
- Observing silicon (Si) device samples to assess image quality and missing zones.
Main Results:
- Achieved excellent penetration and resolution for thick specimens.
- Obtained high-quality images of biological samples and Si devices without missing zones.
- Demonstrated the suitability of UHVEM for 3D observation via electron tomography.
Conclusions:
- The 3 MV UHVEM is a powerful tool for advanced 3D electron tomography.
- UHVEM tomography provides valuable insights in cell biology, pathology, and electrical engineering.
- The technique overcomes limitations of conventional methods for thick sample analysis.
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